Prof. Cécile Hébert

Associate Professor

Research Area

Research activities at CIME are oriented towards development of new Electron Microscopy techniques and their application to existing problems. It is a priority to concentrate on techniques that are relevant to the activities of the other EPFL labs. CIME does not produce samples to be investigated.

As a consequence CIME has no research project alone and most of them are in collaboration with other institutes or laboratories, some in collaboration with industries. The external lab or industry brings the problems to solve and the samples to investigate while CIME offers the technique and develop them to offer top-level and unique investigation tools.

The following electron microscopy techniques are developed at CIME:

- Cathodoluminescense in the STEM
- Computational electron microscopy
- 3D microscopy and EDX analysis with FIB (focused ion beam) nanotomography
- Electron Energy Loss Spectrometry (EELS)
- High resolution TEM (HRTEM)


PH D2 354 (Bâtiment PH)
Station 3
CH-1015 Lausanne